Technology DRCs in VLSI: Width, Spacing, End-of-Line, Min Area, Enclosure and Density Rules
What technology DRCs check and why: width, width- and run-length-dependent spacing, end-of-line, minimum area, enclosure, cut, notch and density rules, how the tech LEF differs from the sign-off runset, and how to debug DRC violations, with illustrative examples, a flowchart and interview Q&As.
