Scan Chain Reordering in VLSI: Scan DEF, Partitions, Hold Timing and ATPG Impact
Scan chain reordering in VLSI physical design explained: why synthesis scan order wastes wirelength, what the scan DEF (START/STOP, FLOATING, ORDERED, PARTITION, MAXBITS) allows, clock-domain, edge-order and lockup-latch rules, chain balancing, scan shift hold timing, verification and ATPG regeneration, with illustrative examples, a debugging flowchart and interview Q&As.