Congestion

Routing congestion in VLSI explained for physical design engineers: how global routers measure GCell capacity, demand and overflow, cell density vs pin density, global, local and layer congestion, floorplan, logic and placement causes, fixes with halos, partial blockages and cell padding, the timing impact, a debugging flowchart and interview Q&As.

Scan chain reordering in VLSI physical design explained: why synthesis scan order wastes wirelength, what the scan DEF (START/STOP, FLOATING, ORDERED, PARTITION, MAXBITS) allows, clock-domain, edge-order and lockup-latch rules, chain balancing, scan shift hold timing, verification and ATPG regeneration, with illustrative examples, a debugging flowchart and interview Q&As.